Memory corruption in Bluetooth HOST due to buffer overflow while parsing the command response received from remote

u'Buffer overflow while processing PDU packet in bluetooth due to lack of check of buffer length before copying into it.' in Snapdragon Auto, Snapdragon Compute, Snapdragon…

u'Buffer overflow while processing a crafted PDU data packet in bluetooth due to lack of check of buffer size before copying' in Snapdragon Auto, Snapdragon Compute, Snapdragon…

Out-of-bounds Read in Windows WLAN Host

Out-of-bounds Read in Windows WLAN Host

Stack-based Buffer Overflow in WLAN Windows Host

Buffer Copy Without Checking Size of Input (`Classic Buffer Overflow`) in WLAN Windows Host

Stack-based Buffer Overflow in WLAN Windows Host

Improper Restriction of Operations within the Bounds of a Memory Buffer in HLOS

Permissions, Privileges, and Access Control issues in TZ Secure OS

Buffer Copy Without Checking Size of Input in Trusted Execution Environment

Memory corruption in HLOS while invoking IOCTL calls from user-space

Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level

Cryptographic issue in HLOS during key management

Memory corruption in TZ Secure OS while loading an app ELF

Memory Corruption in HLOS while importing a cryptographic key into KeyMaster Trusted Application

Memory corruption in WIN Product while invoking WinAcpi update driver in the UEFI region

Memory Corruption in Core due to incorrect type conversion or cast in secure_io_read/write function in TEE

Memory corruption due to double free in core while initializing the encryption key

Memory corruption due to buffer copy without checking the size of input in HLOS when input message size is larger than the buffer capacity

Memory corruption in WLAN due to use after free

Memory corruption due to use after free issue in kernel while processing ION handles in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer…

Improper validation of program headers containing ELF metadata can lead to image verification bypass in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon…

Possible null pointer dereference due to lack of TLB validation for user provided address in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer…

Memory corruption due to improper input validation while processing IO control which is nonstandard in Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics…

u'SMEM partition can be manipulated in case of any compromise on HLOS, thus resulting in access to memory outside of SMEM address range which could lead to memory corruption' in…

Close and bind operations done on a socket can lead to a Use-After-Free condition

Buffer Over-read in BT Controller

Reachable Assertion in WLAN Firmware

Transient DOS while parsing GATT service data when the total amount of memory that is required by the multiple services is greater than the actual size of the services buffer

Transient DOS in Bluetooth Host while rfc slot allocation

Information disclosure due to buffer over-read in Bluetooth Host while A2DP streaming

Information disclosure in WLAN due to improper validation of array index while parsing crafted ANQP action frames in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity,…

Out of bound read in WLAN HOST due to improper length check can lead to DOS in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics…

Possible buffer over read due to lack of size validation while unpacking frame in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics…

Improper Input Validation in Trusted Execution Environment

Cryptographic issue in HLOS as derived keys used to encrypt/decrypt information is present on stack after use

Cryptographic issue in HLOS due to improper authentication while performing key velocity checks using more than one key

Possible out of bound read due to lack of length check of data length for a DIAG event in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer…

Memory corruption in Core due to time-of-check time-of-use race condition during dump collection in trust zone

Memory corruption in display due to time-of-check time-of-use of metadata reserved size in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT,…